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Certificate number:
FM 90696
Scope: The provision of wafer testing for CMOS (Complementary Metal-Oxide-Semiconductor) image sensors and reconstruction wafer.
CMOS(互补型金属氧化物半导体)图像感应芯片的晶圆测试和晶圆重构。
Standard/Scheme number or name | Start Date | Expiry Date |
---|---|---|
ISO 9001:2015 | 2005-01-24 | 2025-06-06 |
Certificate number:
EMS 537696
Scope: The provision of wafer testing for CMOS (Complementary Metal-Oxide-Semiconductor) image sensors and reconstruction wafer.
CMOS(互补型金属氧化物半导体)图像感应芯片的晶圆测试和晶圆重构。
Standard/Scheme number or name | Start Date | Expiry Date |
---|---|---|
ISO 14001:2015 | 2008-09-02 | 2025-06-06 |
Certificate number:
OHS 539527
Scope: The provision of wafer testing for CMOS (Complementary Metal-Oxide-Semiconductor) image sensors and reconstruction wafer.
CMOS(互补型金属氧化物半导体)图像感应芯片的晶圆测试和晶圆重构。
Standard/Scheme number or name | Start Date | Expiry Date |
---|---|---|
ISO 45001:2018 | 2020-07-28 | 2025-06-06 |